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Showing results 1 to 5 of 5

1
Charged Defect Quantification in Pt/Al2O3/In0.53Ga0.47As/InP MOS Capacitors

Long, R. D.; Shin, B.; Monaghan, S.; Cherkaoui, K.; Cagnon, J.; Stemmer, S.; McIntyre, P. C., JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.158, no.5, pp.103 - 107, 2011

2
Effects of Self-Assembled Monolayer and PFPE Lubricant on Wear Characteristics of Flat Silicon Tips

Kim, H. J.; Jang, C. E.; Kim, D. E.; Kim, Y. K.; Choa, S. H.; Hong, S., TRIBOLOGY LETTERS, v.34, no.1, pp.61 - 73, 2009-04

3
Enhancement of the TiO2 Thin-Film Dielectric Constant Through Pretreatment of Ir Substrate

Joo, Dae-Kwon; Park, Jin-Seong; Kang, Sang-Won, ELECTROCHEMICAL AND SOLID STATE LETTERS, v.12, no.3, pp.H77 - H79, 2009

4
Plasma-enhanced ALD of titanium-silicon-nitride using TiCl4, SiH4, and N-2/H-2/Ar plasma

Park, JS; Kang, SW, ELECTROCHEMICAL AND SOLID STATE LETTERS, v.7, no.8, pp.C87 - C89, 2004

5
Three-Dimensional Nanofabrication by Block Copolymer Self-Assembly

Ross, Caroline A.; Berggren, Karl K.; Cheng, Joy Y.; Jung, Yeon Sik; Chang, Jae-Byum, ADVANCED MATERIALS, v.26, no.25, pp.4386 - 4396, 2014-07

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