Double EIM and scalar BPM analyses of birefringence and wavelength shift for TE and TM polarized fields in bent planar lightwave circuits

Abstract

We have applied the effective index method to reduce the two-dimensional refractive index profile into the one-dimensional refractive index structure and modified the wave equations to obtain the paraxial wave equations. Then, TE and TM polarized fields in the curved single-mode planar waveguides are analyzed by using the scalar beam-propagation method employing the finite-difference method with a slab structure. The birefringence for TE and TM polarized fields in bent waveguides is calculated from the phase difference of the optical fields. The wavelength shift due to the birefringence of TE and TM polarized fields in bent waveguides is also calculated.