Studies on the thermal cycling reliability of fine pitch Cu/SnAg double-bump flip chip assemblies on organic substrates: Experimental results and numerical analysis

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Issue Date
2008-05-27
Language
ENG
Citation

2008 58th Electronic Components and Technology Conference, ECTC, pp.2035 - 2043

ISSN
0569-5503
URI
http://hdl.handle.net/10203/157280
Appears in Collection
MS-Conference Papers(학술회의논문)
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