Showing results 1 to 10 of 10
A New Sensing Metric to Reduce Data Fluctuations in a Nanogap-Embedded Field-Effect Transistor Biosensor Kim, Chang-Hoon; Ahn, Jae-Hyuk; Lee, Kyung-Bok; Jung, Cheul-Hee; Park, Hyun-Gyu; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.59, no.10, pp.2825 - 2831, 2012-10 |
Analytical Modeling of a Nanogap-Embedded FET for Application as a Biosensor Choi, Ji-Min; Han, Jin-Woo; Choi, Sung-Jin; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.57, no.12, pp.3477 - 3484, 2010-12 |
Analytical threshold voltage model for double-gate MOSFETs with localized charges Kang, Hongki; Han, Jin-Woo; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.29, no.8, pp.927 - 930, 2008-08 |
Analytical Threshold Voltage Model of Junctionless Double-Gate MOSFETs With Localized Charges Woo, Jong-Ho; Choi, Ji-Min; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.60, no.9, pp.2951 - 2955, 2013-09 |
Bi-directional threshold voltage shift of amorphous InGaZnO thin film transistors under alternating bias stress Kim, Hyunjin; Kim, Beom Jung; Oh, Jungyeop; Choi, Sung-Yool; Park, Hamin, SEMICONDUCTOR SCIENCE AND TECHNOLOGY, v.39, no.2, 2024-02 |
Bias Temperature Instability of a-IGZO TFTs Under Repeated Stress and Recovery Jeong, Yonghee; Kim, Hyunjin; Oh, Jungyeop; Choi, Sung-Yool; Park, Hamin, JOURNAL OF ELECTRONIC MATERIALS, v.52, no.6, pp.3914 - 3920, 2023-06 |
LOOKUP TABLE-BASED ADAPTIVE BODY BIASING OF MULTIPLE MACROS FOR PROCESS VARIATION COMPENSATION AND LOW LEAKAGE Choi, B; Shin, Youngsoo, JOURNAL OF CIRCUITS SYSTEMS AND COMPUTERS, v.19, no.7, pp.1449 - 1464, 2010-11 |
Photoactive Memory by a Si-Nanowire Field-Effect Transistor Kim, Chung-Jin; Choi, Sung-Jin; Ahn, Jae-Hyuk; Han, Jin-Woo; Kim, Ho-Yeon; Yoo, Seung-Hyup; Choi, Yang-Kyu, ACS NANO, v.6, no.2, pp.1449 - 1454, 2012-02 |
Sensitivity of Threshold Voltage to Nanowire Width Variation in Junctionless Transistors Choi, Sung-Jin; Moon, Dong-Il; Kim, Sung-Ho; Duarte, Juan P.; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.32, no.2, pp.125 - 127, 2011-02 |
Universal potential model in tied and separated double-gate MOSFETs with consideration of symmetric and asymmetric structure Han, Jin-Woo; Kim, Chung-Jin; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.55, no.6, pp.1472 - 1479, 2008-06 |
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