Showing results 8 to 21 of 21
Magnetic resonance force microscopy in fast-relaxing spins using a frequency-modulation mode detection method Lee, SangGap; Won, Soon-Ho; Saun, Seung Bo; Lee, Soonchil, NANOTECHNOLOGY, v.18, no.37, pp.375505, 2007-09 |
Measurement uncertainties in resonant characteristics of MEMS resonators Lee, Il; Lee, Jungchul, JOURNAL OF MECHANICAL SCIENCE AND TECHNOLOGY, v.27, no.2, pp.491 - 500, 2013-02 |
Microcantilever actuation via periodic internal heating Lee, Jungchul; King, William P., REVIEW OF SCIENTIFIC INSTRUMENTS, v.78, no.12, 2007-12 |
Microcantilever hotplates: Design, fabrication, and characterization Lee, Jungchul; King, William P., SENSORS AND ACTUATORS A-PHYSICAL, v.136, no.1, pp.291 - 298, 2007-05 |
Microthermogravimetry using a microcantilever hot plate with integrated temperature-compensated piezoresistive strain sensors Lee, Jungchul; King, William P., REVIEW OF SCIENTIFIC INSTRUMENTS, v.79, no.5, 2008-05 |
Modulus-tunable magnetorheological elastomer microcantilevers Lee, Dongkyu; Lee, Moonchan; Jung, Namchul; Yun, Minhyuk; Lee, Jungchul; Thundat, Thomas; Jeon, Sangmin, SMART MATERIALS AND STRUCTURES, v.23, no.5, 2014-05 |
NMR Spectroscopy for Thin Films by Magnetic Resonance Force Microscopy Won, Soon-Ho; Saun, Seung Bo; Lee, Soonchil; Lee, SangGap; Kim, Kiwoong; Han, Yunseok, SCIENTIFIC REPORTS, v.3, pp.3189, 2013-11 |
Parallelism error analysis and compensation for micro-force measurement Choi, IM; Kim, MS; Woo, SY; Kim, Soohyun, MEASUREMENT SCIENCE & TECHNOLOGY, v.15, pp.237 - 243, 2004-01 |
Read/write mechanisms and data storage system using atomic force microscopy and MEMS technology Shin, H; Hong, S; Moon, J; Jeon, JU, ULTRAMICROSCOPY, v.91, no.1-4, pp.103 - 110, 2002-05 |
Routine femtogram-level chemical analyses using vibrational spectroscopy and self-cleaning scanning probe microscopy tips Park, Keunhan; Lee, Jungchul; Bhargava, Rohit; King, William P., ANALYTICAL CHEMISTRY, v.80, no.9, pp.3221 - 3228, 2008-05 |
Suspended microchannel resonators with piezoresistive sensors Lee, Jungchul; Chunara, R.; Shen, W.; Payer, K.; Babcock, K.; Burg, T. P.; Manalis, S. R., LAB ON A CHIP, v.11, no.4, pp.645 - 651, 2011 |
Temperature measurements of heated microcantilevers using scanning thermoreflectance microscopy Kim, Joohyun; Han, Sunwoo; Walsh, Timothy; Park, Keunhan; Lee, Bong Jae; King, William P.; Lee, Jungchul, REVIEW OF SCIENTIFIC INSTRUMENTS, v.84, no.3, 2013-03 |
Temperature-dependent thermomechanical noise spectra of doped silicon microcantilevers Lee, Jungchul; Goericke, Fabian; King, William P., SENSORS AND ACTUATORS A-PHYSICAL, v.145, pp.37 - 43, 2008-07 |
Tribological characteristics of probe tip and PZT media for AFM-based recording technology Chung, KH; Lee, YH; Kim, DE; Yoo, J; Hong, S, IEEE TRANSACTIONS ON MAGNETICS, v.41, no.2, pp.849 - 854, 2005-02 |
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