Magnetic resonance force microscopy in fast-relaxing spins using a frequency-modulation mode detection method

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We describe a magnetic resonance force microscopy experiment carried out using both a fast- relaxing spin system and a frequency- modulation mode detection method, presenting a validation of the measured signal and sensitivity. The detection method applied along with a self- excited cantilever oscillation worked stably without any serious interference due to spurious cantilever excitation despite application of first- harmonic microwave modulation, and thereby successfully created almost the maximum available signal. The signal could be measured without distortion while the magnetic field was swept at a rate of 1.9 G s(-1). The measured sensitivity approached the thermal noise limit of the cantilever with a high quality factor. The experimental results for both signal and noise were in good agreement with theoretical predictions.
Publisher
IOP PUBLISHING LTD
Issue Date
2007-09
Language
English
Article Type
Article
Keywords

ELECTRON-PARAMAGNETIC-RESONANCE; SILICON; CANTILEVERS; DEFECTS; SCALE

Citation

NANOTECHNOLOGY, v.18, no.37, pp.375505

ISSN
0957-4484
DOI
10.1088/0957-4484/18/37/375505
URI
http://hdl.handle.net/10203/91622
Appears in Collection
PH-Journal Papers(저널논문)
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