Browse by Title
Showing results 56601 to 56620 of 278095
| Defect Engineering in Graphene: From Biomimetic Catalysis to Nanoscale Friction Kim, Yong-Hyun, 15th Asian Workshop on First-Principles Electronic Structure Calculations, Institute of Atomic and Molecular Sciences, 2012-11-05 |
| Defect engineering route to boron nitride quantum dots and edge-hydroxylated functionalization for bio-imaging Jung, Jung Hwan; Kotal, Moumita; 장민호; Lee, Junseok; Cho, Yong-Hoon; Kim, Won-Jong; Oh, Il-Kwon, RSC ADVANCES, v.6, no.77, pp.73939 - 73946, 2016-07 |
| Defect Enhanced Boron Diffusion is SiO2 Jin, YG; Chang, Kee-Joo, 한국물리학회 학술발표회, pp.512 - 512, 한국물리학회, 2000 |
| DEFECT EQUILIBRATION AND INTRINSIC STRESS IN UNDOPED HYDROGENATED AMORPHOUS-SILICON KITSUNO, Y; Cho, Gyuseong; DREWERY, J; HONG, WS; PEREZMENDEZ, V, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.33, no.3A, pp.1261 - 1267, 1994-03 |
| Defect Formation and Annealing Behavior in MeV Si Self-Implanted Silicon 조남훈; 장기완; 서경수; 이정용; 노재상, 한국재료학회지, v.6, no.7, pp.733 - 741, 1996-12 |
| DEFECT FORMATION IN THE SOLID-PHASE EPITAXIAL-GROWTH OF GAAS FILMS ON SI (001) SUBSTRATE CHO, KI; Choo, Woong Kil; Lee, JeongYong; Park, Sin Chong; NISHINAGA, T, JOURNAL OF APPLIED PHYSICS, v.69, no.1, pp.237 - 242, 1991-01 |
| Defect formation mechanisms in the interfacial layer due to thermal treatment between the ZnO thin film and the Si substrate Yuk, Jong Min; Lee, Jeong Yong, Asian-Pacific Conference on Surface Science, Asian-Pacific Conference, 2006-12-19 |
| Defect generation by hole injection in hydrogenated amorphous silicon Kim, C; Lee, C; Shin, Sung-Chul, SOLID STATE COMMUNICATIONS, v.100, no.6, pp.377 - 380, 1996-11 |
| Defect generation in hydrogenated amorphous silicon = 수소화된 비정질 규소의 결함 생성에 관한 연구link Jang, Yong-Ho; 장용호; et al, 한국과학기술원, 1993 |
| Defect healing of CVD graphene by selective electroplating for mechanically robust and transparent electrodes = 선택적 전기도금법을 이용한 합성 그래핀의 결함 치유 및 강건 투명 전극 설계link Cho, Minsun; Kim, Taek-Soo; et al, 한국과학기술원, 2019 |
| Defect inspection in semiconductor images using FAST-MCD method and neural network Yu, Jinkyu; Han, Songhee; Lee, Chang-Ock, INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY, v.129, no.3-4, pp.1547 - 1565, 2023-11 |
| DEFECT INSPECTION IN SEMICONDUCTOR IMAGES USING HISTOGRAM FITTING AND NEURAL NETWORKS 유진규; 한송희; 이창옥, JOURNAL OF THE KOREAN SOCIETY FOR INDUSTRIAL AND APPLIED MATHEMATICS, v.26, no.4, pp.263 - 279, 2022-12 |
| Defect inspection in semiconductor images using statistical methods and neural networks = 통계적 방법과 신경망을 이용한 반도체 영상에서 결함 검사link Yu, Jinkyu; Lee, Chang-Ock; et al, 한국과학기술원, 2023 |
| Defect Luminescence in Heavily Si-doped n- and p-type GaAs Park, Hae Yong; Kim, Jae Eun, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.36, no.1, pp.42 - 48, 2000-01 |
| Defect modes in a two-dimensional square lattice of square rods Kee, Chul-Sik; Kim, Jae-Eun; Park, Hae-Yong; Chang, Kee-Joo, PHYSICAL REVIEW E, v.58, no.6, pp.7908 - 7912, 1998-12 |
| Defect probability of directed self-assembly lithography: fast identification and post-placement optimization Shim, Seongbo; Chung, Woo Hyun; Shin, Youngsoo, 2015 International Conference On Computer Aided Design, pp.404 - 409, ACM SIGDA and IEEE CEDA, 2015-11-03 |
| Defect properties and doping efficiency in P-doped ZnO Chang, Kee-Joo; Lee, W.-J.; Kang, J., 3rd ZnO Workshop, 2005-10-07 |
| Defect properties and p-type doping efficiency in phosphorus-doped ZnO Lee, Woo-Jin; Joon Goo, Kang; Chang, Kee-Joo, PHYSICAL REVIEW B, v.73, pp.024117 - 024117, 2006-01 |
| Defect Properties of Phosphorus Dopants in ZnO Chang, Kee-Joo; Lee, W.-J.; Kang, J., 한국물리학회 가을학술논문발표회, pp.618 - 618, 한국물리학회, 2004-10 |
| Defect properties of Si impurities in HfO2: a physical origin of the threshold voltage problem in hafnium-based MOS devices Chang, Kee-Joo; Kim, D.Y.; Kang, J., 한국물리학회 가을학술논문발표회 , pp.547 - 547, 한국물리학회, 2005-10 |
Discover
Type
Open Access
Date issued
- 32,994 2020 - 2024
- 100,065 2010 - 2019
- 75,675 2000 - 2009
- 44,727 1990 - 1999
- 14,360 1980 - 1989
- 62 1964 - 1969