Defect formation mechanisms in the interfacial layer due to thermal treatment between the ZnO thin film and the Si substrate
- Publisher
- Asian-Pacific Conference
- Issue Date
- 2006-12-19
- Language
- English
- Citation
Asian-Pacific Conference on Surface Science
- Appears in Collection
- MS-Conference Papers(학술회의논문)
- Files in This Item
- There are no files associated with this item.
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