Depth-resolved optical studies of excitonic and phonon-assisted transitions in ZnO epilayers

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The authors report depth-resolved optical properties of excitonic and phonon-assisted transitions in ZnO epilayers by photoluminescence (PL) and cathodoluminescence. A weaker free exciton (FX) emission than its first longitudinal optical phonon replica (FX-1LO) is observed at elevated temperatures (T > 150 K) for interior area, while a stronger FX than FX-1LO is seen at all temperatures for top surface area of the sample. The authors exclude out a possible self-absorption process by PL excited at back surface of the sample. Therefore, the authors conclude that the different intensity ratios of FX and FX-1LO depending on the sample depth are strongly associated with extrinsic features of ZnO. (c) 2006 American Institute of Physics.
Publisher
AMER INST PHYSICS
Issue Date
2006-11
Language
English
Article Type
Article
Keywords

MOLECULAR-BEAM EPITAXY; PHOTOLUMINESCENCE; EMISSION

Citation

APPLIED PHYSICS LETTERS, v.89, pp.1681 - 1688

ISSN
0003-6951
DOI
10.1063/1.2388252
URI
http://hdl.handle.net/10203/91593
Appears in Collection
PH-Journal Papers(저널논문)
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