인쇄회로기판의 통전검사를 위한 가변순응력을 갖는 프로브시스템 A Variably Compliable Probe System for the In-Circuit of a PCB

Publisher
제어,자동화,시스템공학회
Issue Date
1997-06
Language
KOR
Citation

제어,자동화,시스템공학 논문지, v.3, no.3, pp.323 - 331

URI
http://hdl.handle.net/10203/71477
Appears in Collection
NE-Journal Papers(저널논문)
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