인쇄회로기판의 통전검사를 위한 가변순응력을 갖는 프로브시스템A Variably Compliable Probe System for the In-Circuit of a PCB
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 심재홍 | ko |
| dc.contributor.author | 조형석 | ko |
| dc.contributor.author | 김성권 | ko |
| dc.date.accessioned | 2013-02-27T23:26:38Z | - |
| dc.date.available | 2013-02-27T23:26:38Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1997-06 | - |
| dc.identifier.citation | 제어,자동화,시스템공학 논문지, v.3, no.3, pp.323 - 331 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/71477 | - |
| dc.language | Korean | - |
| dc.publisher | 제어,자동화,시스템공학회 | - |
| dc.title | 인쇄회로기판의 통전검사를 위한 가변순응력을 갖는 프로브시스템 | - |
| dc.title.alternative | A Variably Compliable Probe System for the In-Circuit of a PCB | - |
| dc.type | Article | - |
| dc.type.rims | ART | - |
| dc.citation.volume | 3 | - |
| dc.citation.issue | 3 | - |
| dc.citation.beginningpage | 323 | - |
| dc.citation.endingpage | 331 | - |
| dc.citation.publicationname | 제어,자동화,시스템공학 논문지 | - |
| dc.contributor.localauthor | 조형석 | - |
| dc.contributor.nonIdAuthor | 심재홍 | - |
| dc.contributor.nonIdAuthor | 김성권 | - |
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