Measurement of Thermal Conductivities of SiN and TbFeCo Fiims
The effective them1 conductivities of SiN
and TbFeCo thin films were masulltd by conparing
the length and width of polarizing mcroscope inage of
them-nagnetically written dormins with those of
calculated isothem for the hilayer structum of
subsh'atdSi3N4/Tb22F ~oC08/SiN3 4. The multing data
we= applied to the quadrillayer shuchrre of substratel
Si3N4/Tb22Fe70Cos/Si3N4/Ala,n d the length of calculated
isotherm was tumed out to agree with that of written
dounin.
- Publisher
- IEEE
- Issue Date
- 1996-09
- Citation
IEEE Transactions on Magnetics, Vol.32, No.5
- ISSN
- 00I8-9464
- Appears in Collection
- PH-Journal Papers(저널논문)
- Files in This Item
- 041.pdf(319.96 kB)Download
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