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Bake stability of CdTe and ZnS on HgCdTe: An x-ray photoelectron spectroscopy study Jha, SK; Srivastava, P; Pal, R; Anjali; Sehgal, HK; Lee, Hee Chul; Agnihotri, OP; et al, JOURNAL OF ELECTRONIC MATERIALS, v.32, no.8, pp.899 - 905, 2003-08 |
Investigation of Border Trap Characteristics in the AlON/GeO2/Ge Gate Stacks Seo, Yujin; Kim, Choong-Ki; Lee, Tae-In; Hwang, Wan Sik; Yu, Hyun-Yong; Choi, Yang-Kyu; Cho, Byung Jin, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.64, no.10, pp.3998 - 4001, 2017-10 |
Tensile-strained germanium CMOS integration on silicon Zang, H; Loh, WY; Ye, JD; Lo, GQ; Cho, Byung Jin, IEEE ELECTRON DEVICE LETTERS, v.28, no.12, pp.1117 - 1119, 2007-12 |
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