Browse "School of Electrical Engineering(전기및전자공학부)" by Title 

Showing results 15621 to 15640 of 51065

15621
Effect of channel correlation on the capacity scaling in wireless networks

Lee, SH; Chung, Sae-Young, 2008 IEEE International Symposium on Information Theory, ISIT 2008, pp.1128 - 1132, IEEE, 2008-07-06

15622
EFFECT OF CHANNEL ERRORS ON THE PERFORMANCE OF LPC VOCODERS

Un, Chong-Kwan; LEE, SJ, IEEE TRANSACTIONS ON ACOUSTICS SPEECH AND SIGNAL PROCESSING, v.31, no.1, pp.234 - 237, 1983-02

15623
Effect of channel orientation in p-type nanowire Schottky barrier metal-oxide-semiconductor field-effect transistors

Shin, Mincheol, APPLIED PHYSICS LETTERS, v.97, no.9, pp.092108, 2010-08

15624
Effect of collision on movement tracking using active RFID power measurement

Kim T.; Lee S.; Park, Sin Chong, 6th IEEE Consumer Communications and Networking Conference, CCNC 2009, pp.1 - 4, 2009-01-10

15625
Effect of communication infrastructure delays for EV/ESS aggregation on frequency regulation and its market = 전기차/에너지 저장 장치 애그리게이션을 위한 통신 인프라 지연이 주파수 제어 및 시장에 미치는 영향link

Ko, Kab Seok; 고갑석; et al, 한국과학기술원, 2017

15626
Effect of Control and Data frame Overhead on the Capacity Scaling of a Hierarchical Cooperation Scheme

Kim, T.H.; Chu, E.M.; Bang, I.K.; Kim, S.H.; Sung, Dan Keun, IEEE WCNC 2014, IEEE, 2014-04

15627
Effect of cooperative and selection relaying schemes on multiuser diversity in downlink cellular systems with relays

Kang, Min Suk; Jung, Bang Chul; Sung, Dan Keun, JOURNAL OF COMMUNICATIONS AND NETWORKS, v.10, no.2, pp.175 - 185, 2008-06

15628
Effect of Coupling Between Multiple Transmitters or Multiple Receivers on Wireless Power Transfer

Ahn, Duk-Ju; Hong, Song-Cheol, IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, v.60, no.7, pp.2602 - 2613, 2013-07

15629
Effect of decoupling capacitor on signal integrity in applications with reference plane change

Lee, J.; Lu, A.C.W.; Fan, W.; Wai, L.L.; Kim, Joungho, 53rd Electronic Components and Technology Conference, 2003, pp.1283 - 1288, IEEE, 2003-05-27

15630
Effect of degree of coherence in optical lithography using dummy diffraction mask

Yim, D; Lee, S; Lee, S; Oh, YH; Chung, HB; Yoo, Hyung Joun, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.35, no.2A, pp.780 - 785, 1996-02

15631
EFFECT OF DIHEDRAL ANGLE ON THE MORPHOLOGY OF GRAINS IN A MATRIX PHASE

Park, HyoHoon; Yoon, Duk Yong, METALLURGICAL TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE, v.16, no.5, pp.923 - 928, 1985

15632
Effect of Diversity and FEC Coding on DS/CDMA Mobile Radio System

Ha, Jeongseok, ICW95, pp.0 - 0, IEEE, 1995-10-01

15633
Effect of dormant registration on performance of mobility management based on IP paging in wireless data networks

Lee, JongWook; Lee, Hye Jeong; Cho, Dong-Ho, AEU-INTERNATIONAL JOURNAL OF ELECTRONICS AND COMMUNICATIONS, v.59, no.5, pp.319 - 323, 2005-07

15634
Effect of Dual Coplanar Electrodes on Mercury-Free Flat Fluorescent Lamps for Liquid Crystal Display

Park, Hyoung-Bin; Lee, Seong-Eui; Kim, Gi Young; Lee, Young Dong; Choi, Kyung Cheol, JOURNAL OF DISPLAY TECHNOLOGY, v.2, no.1, pp.60 - 67, 2006-03

15635
Effect of Dust and Hot Spots on the Thermal Stability of Laser Sails

Jaffe, Gabriel R.; Holdman, Gregory R.; Jang, Min Seok; Feng, Demeng; Kats, Mikhail A.; Brar, Victor Watson, NANO LETTERS, v.23, no.15, pp.6852 - 6858, 2023-07

15636
Effect of dysprosium and lutetium metal buffer layers on the resistive switching characteristics of Cu-Sn alloy-based conductive-bridge random access memory

Vishwanath, Sujaya Kumar; Woo, Hyunsuk; Jeon, Sanghun, NANOTECHNOLOGY, v.29, no.38, 2018-09

15637
Effect of EBG structures for reducing noise in multi-layer PCBs for digital systems

Chung, D.; Kim, T.H.; Ryu, C.; Engin, E.; Swaminathan, M.; Kim, Joungho, IEEE 15th Topical Meeting on Electrical Performance of Electronic Packaging, pp.253 - 256, IEEE, 2006-10-23

15638
Effect of Electromagnetic Interference on Human Body Communication

Hwang, Jung-Hwan; Kang, Tae-Wook; Kwon, Jong-Hwa; Park, Seong-Ook, IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, v.59, no.1, pp.48 - 57, 2017-02

15639
Effect of electron-beam lithography on thin gate oxide reliability

Cho, Byung Jin; Chong, PF; Chor, EF; Joo, MS, 8th International Symp. on the Physical and Failure Analysis of Integrated Circuits (IPFA), pp.55 - 55, 2001-07-09

15640
Effect of Enviromental Temperature on Discharge Characteristics of R, G, B Phosphor Layer in AC PDP

Choi, Kyung Cheol, , 2001-12

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