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College of Natural Sciences(자연과학대학)Graduate School of Nanoscience and Technology(나노과학기술대학원)NT-Conference Papers(학술회의논문)

Detecting defects with thermoelectricity at the atomic scale

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Lee, Eui-Sup / Kim, Yong-Hyunresearcher / Yeo, Hogi / Cho, Sanghee
Publisher
The University of TEXAS at Austin
Issue Date
2014-08-12
Language
English
Citation

International Conference on Physics and Semiconductors (ICPS 2014)

URI
http://hdl.handle.net/10203/192041
Appears in Collection
NT-Conference Papers(학술회의논문)
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