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Showing results 3 to 5 of 5

3
Device reliability under electrical stress and photo response of oxide TFTs

Park, Sang-Hee Ko; Ryu, Min-Ki; Yoon, Sung-Min; Yang, Shinhyuk; Hwang, Chi-Sun; Jeon, Jae-Hong, JOURNAL OF THE SOCIETY FOR INFORMATION DISPLAY, v.18, no.10, pp.779 - 788, 2010-10

4
Improved Electrical Performance and Bias Stability of Solution-Processed Active Bilayer Structure of Indium Zinc Oxide based TFT

Seo, Jinsuk; Bae, Byeong-Soo, ACS APPLIED MATERIALS & INTERFACES, v.6, no.17, pp.15335 - 15343, 2014-09

5
Light Effects on the Bias Stability of Transparent ZnO Thin Film Transistors

Shin, Jae-Heon; Lee, Ji-Su; Hwang, Chi-Sun; Park, Sang-Hee Ko; Cheong, Woo-Seok; Ryu, Minki; Byun, Chun-Won; et al, ETRI JOURNAL, v.31, no.1, pp.62 - 64, 2009-02

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