Browse "Dept. of Materials Science and Engineering(신소재공학과)" by Type Article

Showing results 4101 to 4120 of 7224

4101
MBE growth of wurtzite GaN on LaAlO3 (100) substrate

Lee, JJ; Park, YS; Yang, CS; Kim, HS; Kim, KH; Kang, KY; Kang, TW; et al, JOURNAL OF CRYSTAL GROWTH, v.213, no.1-2, pp.33 - 39, 2000-05

4102
MBE 방법으로 성장된 (110)CoGa/GaAs의 구조적 특성

우용득; 강태원; 이정용, 새물리, v.32, no.5, pp.720 - 726, 1992-12

4103
MBE로 성장시킨 $GaAs/Al_{0.3}Ga_{0.7}A_{s}층의 고분해능 투과전자현미경에 의한 연구

이정용, 전자공학회논문지, v.26, no.8, pp.76 - 83, 1989-08

4104
MBE로 성장시킨 GaAs/AL0.3Ga0.7As층의 고분해능 투과전자현미경에 의한 연구

이정용, 전자공학회논문지, v.26, no.8, pp.76 - 83, 1989-12

4105
MBE로 성장한 대칭적으로 변형된 Si/Ge 단원자층 초격자의 특성

우용득; 김문덕; 한명수; 손윤; 강태원; 이정용, 새물리, v.32, no.5, pp.715 - 719, 1992-12

4106
Measurement and Analysis for Residual Warpage of Chip-on-Flex (COF) and Chip-in-Flex (CIF) Packages

Jang, Jae-Won; Suk, Kyoung-Lim; Paik, Kyung-Wook; Lee, Soon-Bok, IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, v.2, no.5, pp.834 - 840, 2012-05

4107
Measurement and calculation of optical band gap of chromium aluminum oxide films

Kim, E; Jiang, ZT; No, Kwangsoo, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.39, no.8, pp.4820 - 4825, 2000-08

4108
Measurement and Visualization of Doping Profile in Silicon Using Kelvin Probe Force Microscopy (KPFM)

Shin, Hyunjung; Lee, Bongki; Kim, Chanhyung; Park, Hongsik; Min, Dong-Ki; Jung, Juwhan; Hong, Seungbum; et al, ELECTRONIC MATERIALS LETTERS, v.1, no.2, pp.127 - 133, 2005-12

4109
Measurement of Acoustic Properties of polyurethane by the through Transmission Method

김태식; 이기석; 안봉영; 이진형, 한국음향학회지, v.19, no.1, pp.40 - 47, 2000

4110
Measurement of Quantum Yields of Monolayer TMDs Using Dye-Dispersed PMMA Thin Films

Roy, Shrawan; Sharbirin, Anir S.; Lee, Yongjun; Kim, Won Bin; Kim, Tae Soo; Cho, Kiwon; Kang, Kibum; et al, NANOMATERIALS, v.10, no.6, 2020-06

4111
Measurement of reduction kinetics in Nb2O5-doped SrTiO3 by use of a new technique of liquid film migration

Koo, SY; Lee, GG; Kang, Suk-Joong L, JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, v.66, pp.498 - 503, 2005-02

4112
Measurement of residual stress in diamond films obtained using chemical vapor deposition

Kim, JG; Yu, Jin, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS EXPRESS LETTERS, v.37, no.7B, pp.890 - 893, 1998-07

4113
Measurement of the differential Pockels and Kerr coefficients of thin films by a two-beam polarization interferometer with a reflection configuration

Spirin, VV; Mendieta, FJ; No, Kwangsoo, FERROELECTRICS, v.271, pp.1911 - 1916, 2002

4114
Measurement of the indium concentration in high indium content InGaN layers by scanning transmission electron microscopy and atom probe tomography

Mehrtens, T.; Schowalter, M.; Tytko, D.; Choi, Pyuck-Pa; Raabe, D.; Hoffmann, L.; Joenen, H.; et al, APPLIED PHYSICS LETTERS, v.102, no.13, 2013-04

4115
Measurement of the linear electro-optic coefficients of sol-gel derived strontium barium niobate thin films using a two-beam polarization interferometer

Koo, J; Lee, C; Jang, JH; No, Kwangsoo; Bae, Byeong-Soo, APPLIED PHYSICS LETTERS, v.76, no.19, pp.2671 - 2673, 2000-05

4116
Measurement of the Pockels coefficient of lead zirconate titanate thin films by a two-beam polarization interferometer with a reflection configuration

Spirin, VV; Lee, C; No, Kwangsoo, JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS, v.15, no.7, pp.1940 - 1946, 1998-07

4117
Measurement of the quadratic electrooptic coefficient of lead zirconate titanate thin film by a two-beam polarization interferometer

Spirin, VV; Lee, CH; No, Kwangsoo, OPTICS COMMUNICATIONS, v.158, no.1-6, pp.239 - 249, 1998-12

4118
Measurement of the thermo-optic coefficients in sol-gel derived inorganic-organic hybrid material films

Kang, Eun-Seok; Lee, Tae-Ho; Bae, Byeong-Soo, APPLIED PHYSICS LETTERS, v.81, no.8, pp.1438 - 1440, 2002-08

4119
Measurement of thermal expansion coefficient of poly-Si using microgauge sensors

Chae, Jung-Hun; Lee, Jae-Youl; Kang, Sang-Won, SPIE Vol. 3242, pp.202-211, 1997

4120
Measurement of thermal expansion coefficient of poly-Si using microgauge sensors

Chae, JH; Lee, JY; Kang, Sang-Won, SENSORS AND ACTUATORS A-PHYSICAL, v.75, no.3, pp.222 - 229, 1999-06

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