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Showing results 31601 to 31620 of 99949

31601
Electron Energy Distribution Function of Pure Helium in Cyclotron Resonance

Un, Chong-Kwan; B.C.Lutz, JOURNAL OF APPLIED PHYSICS, v.43, no.5, pp.2193 - 2196, 1972-05

31602
Electron heating in rf capacitive discharges at atmospheric-to-subatmospheric pressures

Park, Sanghoo; Choe, Wonho; Kim, Holak, SCIENTIFIC REPORTS, v.8, pp.10217, 2018-07

31603
Electron holography study for two-dimensional dopant profile measurement with specimens prepared by backside ion milling

Yoo, Jung Ho; Yang, Jun-Mo; Ulugbek, Shaislamov; Ahn, Chi Won; Hwang, Wook-Jung; Park, Joong Keun; Park, Chul Min; et al, JOURNAL OF ELECTRON MICROSCOPY, v.57, no.1, pp.13 - 18, 2008-01

31604
Electron Information in Single-and Dual-Frequency Capacitive Discharges at Atmospheric Pressure

Park, Sanghoo; Choe, Wonho; Moon, Se Youn; Shi, Jian Jun, SCIENTIFIC REPORTS, v.8, 2018-05

31605
Electron Injection from Copper Diimine Sensitizers into TiO2: Structural Effects and Their Implications for Solar Energy Conversion Devices

Mara, Michael W.; Bowman, David N.; Buyukcakir, Onur; Shelby, Megan L.; Haldrup, Kristoffer; Huang, Jier; Harpham, Michael R.; et al, JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, v.137, no.30, pp.9670 - 9684, 2015-08

31606
Electron injection via pentacene thin films for efficient inverted organic light-emitting diodes

Yun, Chang-Hun; Cho, Hyun-Su; Kang, Hye-Seung; Lee, Young-Mi; Park, Yong-Sup; Yoo, Seung-Hyup, APPLIED PHYSICS LETTERS, v.95, no.5, 2009-08

31607
Electron interactions in an antidot in the integer quantum Hall regime

Sim, Heung-Sun; Kataoka, M.; Ford, C. J. B., PHYSICS REPORTS-REVIEW SECTION OF PHYSICS LETTERS, v.456, no.4, pp.127 - 165, 2008-02

31608
Electron interference due to localization paths in an Aharanov-Bohm ring

Park, KW; Lee, SJ; Shin, Mincheol; Lee, EH; Kwon, HC, PHYSICAL REVIEW B, v.54, no.3, pp.1498 - 1501, 1996-07

31609
Electron Irradiation Induced Defects in GaAs II- Complex Defects

Han Jo Lim; Hong Sup Kim; Byungdoo Choe; Hae Yong Park, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.23, pp.45 - 50, 1990

31610
Electron microscopy analysis of soft materials with freeze-fracture techniques

Kim, Wantae; Yoon, Dong Ki, BULLETIN OF THE KOREAN CHEMICAL SOCIETY, v.44, no.2, pp.153 - 162, 2023-02

31611
Electron microscopy of high pressure crystallised poly (p-phenylene sulfide)

Lu, J; Oh, Il-Kwon; Huang, R; Cheng, TH; Wang, XL, PLASTICS RUBBER AND COMPOSITES, v.37, no.5-6, pp.263 - 267, 2008

31612
Electron microscopy study of novel Pt nanowires synthesized in the spaces of silica mesoporous materials

Terasaki, O; Liu, Z; Ohsuna, T; Shin, HJ; Ryoo, Ryong, MICROSCOPY AND MICROANALYSIS, v.8, no.1, pp.35 - 39, 2002-02

31613
Electron Mobility Enhancement of Extremely Thin Body In0.7Ga0.3As-on-Insulator Metal-Oxide-Semiconductor Field-Effect Transistors on Si Substrates by Metal-Oxide-Semiconductor Interface Buffer Layers

Kim, SangHyeon; Yokoyama, Masafumi; Taoka, Noriyuki; Iida, Ryo; Lee, Sunghoon; Nakane, Ryosho; Urabe, Yuji; et al, APPLIED PHYSICS EXPRESS, v.5, no.1, 2012-01

31614
Electron mobility enhancement using ultrathin pure Ge on Si substrate

Yeo, CC; Cho, Byung Jin; Gao, E; Lee, SJ; Lee, AH; Yu, CY; Liu, CW; et al, IEEE ELECTRON DEVICE LETTERS, v.26, no.10, pp.761 - 763, 2005-10

31615
Electron Mobility in Surface- and Buried-Channel Flatband In0.53Ga0.47As MOSFETs With ALD Al2O3 Gate Dielectric

Bentley, Steven J.; Holland, Martin; Li, Xu; Paterson, Gary W.; Zhou, HP; Ignatova, Olesya; Thoms, Stephen; et al, IEEE ELECTRON DEVICE LETTERS, v.32, no.4, pp.494 - 496, 2011-04

31616
Electron pair tunneling resonance in a double-dot interferometry

Park, Jinhong; Sim, Heung-Sun, PHYSICAL REVIEW B, v.82, no.23, pp.235318 - 235318-5, 2010-12

31617
Electron scattering mechanisms in indium-tin-oxide thin films: grain boundary and ionized impurity scattering

Lee, HC; Park, OOk, VACUUM, v.75, no.3, pp.275 - 282, 2004-07

31618
Electron spin relaxations of phosphorus donors in bulk silicon under large electric field

Park, Daniel K.; Park, Sejun; Jee, Hyejung; Lee, Soonchil, SCIENTIFIC REPORTS, v.9, pp.2951, 2019-02

31619
Electron temperature analysis of two-gas-species inductively coupled plasma

Bai, KH; Chang, Hong-Young; Uhm, HS, APPLIED PHYSICS LETTERS, v.79, no.11, pp.1596 - 1598, 2001-09

31620
Electron temperature and pressure dependences of nonlinear phenomena in dust particle oscillation in dc plasmas

Seon, C. R.; Park, S.; Choe, Won-Ho; Seo, C. H.; Park, H. Y.; Chai, Kil-Byoung; Shin, Y. H., NEW JOURNAL OF PHYSICS, v.10, 2008-01

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