DC Field | Value | Language |
---|---|---|
dc.contributor.author | Yoon, Jong-Moon | ko |
dc.contributor.author | Kim, Eun-Tae | ko |
dc.contributor.author | Lee, Jeong-Yong | ko |
dc.contributor.author | Kim, Yong-Tae | ko |
dc.date.accessioned | 2013-03-09T08:46:20Z | - |
dc.date.available | 2013-03-09T08:46:20Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2009-10 | - |
dc.identifier.citation | JAPANESE JOURNAL OF APPLIED PHYSICS, v.48, no.10 | - |
dc.identifier.issn | 0021-4922 | - |
dc.identifier.uri | http://hdl.handle.net/10203/95906 | - |
dc.description.abstract | The microstructure of Sb-Se-Te ternary alloy thin films annealed at 220, 230, and 300 degrees C by rapid thermal annealing (RTA) was investigated using high-resolution transmission election microscopy (HR-TEM) and X-ray diffraction (XRD) analysis. Compared to the T(m) of Ge(2)Sb(2)Te(5) (similar to 616 degrees C), the lower T(m) of the Sb-Se-Te (417 degrees C) thin film can contribute toward reducing power consumption for the reset process of phase change materials. The horizontal long grains-grown along the interface in a fully crystallized Sb-Se-Te thin film sample and annealed at 300 degrees C for 10 min-were hexagonal structured Sb(2)SeTe(2) with 15 layers; the c-axis was perpendicular to the substrate. (C) 2009 The Japan Society of Applied Physics | - |
dc.language | English | - |
dc.publisher | INST PURE APPLIED PHYSICS | - |
dc.subject | ATOMIC-FORCE MICROSCOPY | - |
dc.subject | GE2SB2TE5 THIN-FILMS | - |
dc.subject | PHASE-CHANGE | - |
dc.subject | CHALCOGENIDE GLASSES | - |
dc.subject | GRAIN-GROWTH | - |
dc.subject | MEMORY | - |
dc.subject | NONVOLATILE | - |
dc.subject | TRANSITIONS | - |
dc.subject | NUCLEATION | - |
dc.subject | SYSTEMS | - |
dc.title | Transmission Electron Microscopy Study on the Crystallization of Sb-Se-Te Ternary Alloys | - |
dc.type | Article | - |
dc.identifier.wosid | 000271527100052 | - |
dc.identifier.scopusid | 2-s2.0-77952692839 | - |
dc.type.rims | ART | - |
dc.citation.volume | 48 | - |
dc.citation.issue | 10 | - |
dc.citation.publicationname | JAPANESE JOURNAL OF APPLIED PHYSICS | - |
dc.identifier.doi | 10.1143/JJAP.48.105501 | - |
dc.contributor.localauthor | Lee, Jeong-Yong | - |
dc.contributor.nonIdAuthor | Kim, Yong-Tae | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordPlus | ATOMIC-FORCE MICROSCOPY | - |
dc.subject.keywordPlus | GE2SB2TE5 THIN-FILMS | - |
dc.subject.keywordPlus | PHASE-CHANGE | - |
dc.subject.keywordPlus | CHALCOGENIDE GLASSES | - |
dc.subject.keywordPlus | GRAIN-GROWTH | - |
dc.subject.keywordPlus | MEMORY | - |
dc.subject.keywordPlus | NONVOLATILE | - |
dc.subject.keywordPlus | TRANSITIONS | - |
dc.subject.keywordPlus | NUCLEATION | - |
dc.subject.keywordPlus | SYSTEMS | - |
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