Strength of chemical vapor deposited silicon carbide films using an internal pressurization test

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dc.contributor.authorKim Min Woo-
dc.contributor.authorKim Jong Ho-
dc.contributor.authorLee Hyun Keun-
dc.contributor.authorPark Ji-Yeon-
dc.contributor.authorKIm Weon-Ju-
dc.contributor.authorKim Do Kyung-
dc.date.accessioned2013-03-09T02:08:53Z-
dc.date.available2013-03-09T02:08:53Z-
dc.date.created2012-02-06-
dc.date.issued2009-06-
dc.identifier.citationJOURNAL OF CERAMIC PROCESSING RESEARCH, v.10, no.3, pp.373 - 377-
dc.identifier.issn1229-9162-
dc.identifier.urihttp://hdl.handle.net/10203/95081-
dc.description.abstractSilicon carbide coatings for tri-isotropic (TRISO)-coated fuel particles were fabricated using a chemical vapor deposition process at different deposition temperatures. An internal pressurization mechanical testing method, devised to measure the strength of the silicon carbide coatings, was investigated. An enhanced strength equation was derived using finite element analysis and verified by an experimental method utilizing a soda-lime glass standard specimen. The strength and Weibull modulus of the silicon carbide were measured using the internal pressurization technique. The effect of the microstructure and deposition temperature on the strength of the silicon carbide coating is discussed. Finally the reliability of silicon carbide coatings for tri-isotropic-coated fuel particles was discussed in terms of the coating strength with a correlation of the effective surface area and Weibull statistics.-
dc.languageKOR-
dc.publisher세라믹공정연구센터-
dc.subjectREACTANT DEPLETION-
dc.subjectFRACTURE STRENGTH-
dc.subjectSIC FILMS-
dc.subjectPARTICLE-
dc.titleStrength of chemical vapor deposited silicon carbide films using an internal pressurization test-
dc.typeArticle-
dc.identifier.wosid000268073200025-
dc.type.rimsART-
dc.citation.volume10-
dc.citation.issue3-
dc.citation.beginningpage373-
dc.citation.endingpage377-
dc.citation.publicationnameJOURNAL OF CERAMIC PROCESSING RESEARCH-
dc.contributor.localauthorKim Do Kyung-
dc.contributor.nonIdAuthorKim Min Woo-
dc.contributor.nonIdAuthorKim Jong Ho-
dc.contributor.nonIdAuthorLee Hyun Keun-
dc.contributor.nonIdAuthorPark Ji-Yeon-
dc.contributor.nonIdAuthorKIm Weon-Ju-
dc.type.journalArticleArticle-
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