Anisotropic properties of periodically polarity-inverted zinc oxide structures

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We report on the anisotropic structural properties of periodically polarity-inverted (PPI) ZnO structures grown on patterned templates. The etching and growth rates along < 11 (2) over bar0 > direction of ZnO structures are higher than those of < 10 (1) over bar0 > direction of ZnO films. From the strain evaluation by Raman spectroscopy, compressive strains are observed in all PPI ZnO samples with different stripe pattern size and the smaller pattern size is more effective to residual stress relaxation. The detailed structures at transition region show relationship with the anisotropic crystal quality. (C) 2010 American Institute of Physics. [doi:10.1063/1.3436575]
Publisher
AMER INST PHYSICS
Issue Date
2010-06
Language
English
Article Type
Article
Keywords

ZNO; GROWTH; FILMS; GAN; SENSORS

Citation

JOURNAL OF APPLIED PHYSICS, v.107, no.12

ISSN
0021-8979
DOI
10.1063/1.3436575
URI
http://hdl.handle.net/10203/94566
Appears in Collection
MS-Journal Papers(저널논문)
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