DC Field | Value | Language |
---|---|---|
dc.contributor.author | Young-Min Kim | ko |
dc.contributor.author | Hu Young Jeong | ko |
dc.contributor.author | Seong-Hyeon Hong | ko |
dc.contributor.author | Sung-Yoon Chung | ko |
dc.contributor.author | Jeong Yong Lee | ko |
dc.contributor.author | Youn-Joong Kim | ko |
dc.date.accessioned | 2013-03-08T21:45:40Z | - |
dc.date.available | 2013-03-08T21:45:40Z | - |
dc.date.created | 2012-03-16 | - |
dc.date.created | 2012-03-16 | - |
dc.date.issued | 2010-12 | - |
dc.identifier.citation | JOURNAL OF ANALYTICAL SCIENCE & TECHNOLOGY, v.1, no.2, pp.134 - 140 | - |
dc.identifier.issn | 2093-3134 | - |
dc.identifier.uri | http://hdl.handle.net/10203/94393 | - |
dc.language | Korean | - |
dc.publisher | Korea Basic Science Institute | - |
dc.title | Practical approaches to mitigation of specimen charging in High-Resolution Transmission Electron Microscopy | - |
dc.type | Article | - |
dc.type.rims | ART | - |
dc.citation.volume | 1 | - |
dc.citation.issue | 2 | - |
dc.citation.beginningpage | 134 | - |
dc.citation.endingpage | 140 | - |
dc.citation.publicationname | JOURNAL OF ANALYTICAL SCIENCE & TECHNOLOGY | - |
dc.contributor.localauthor | Jeong Yong Lee | - |
dc.contributor.nonIdAuthor | Young-Min Kim | - |
dc.contributor.nonIdAuthor | Hu Young Jeong | - |
dc.contributor.nonIdAuthor | Seong-Hyeon Hong | - |
dc.contributor.nonIdAuthor | Sung-Yoon Chung | - |
dc.contributor.nonIdAuthor | Youn-Joong Kim | - |
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