Flow lines with regular service times: Evolution of delay, state dependent failures and semiconductor wafer fabrication

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Publisher
IEEE
Issue Date
2008-08-23
Language
ENG
Citation

4th IEEE Conference on Automation Science and Engineering, CASE 2008, pp.247 - 252

URI
http://hdl.handle.net/10203/9163
Appears in Collection
IE-Conference Papers(학술회의논문)
Files in This Item
2008-IEEE%20CASE-Regular%20Flow%20Lines.FINAL.pdf(184.57 kB)Download

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