Flow lines with regular service times: Evolution of delay, state dependent failures and semiconductor wafer fabrication

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dc.contributor.authorMorrison, James R-
dc.date.accessioned2009-05-27T02:31:04Z-
dc.date.available2009-05-27T02:31:04Z-
dc.date.created2012-02-06-
dc.date.issued2008-08-23-
dc.identifier.citation4th IEEE Conference on Automation Science and Engineering, CASE 2008, v., no., pp.247 - 252-
dc.identifier.urihttp://hdl.handle.net/10203/9163-
dc.languageENG-
dc.language.isoen_USen
dc.publisherIEEE-
dc.titleFlow lines with regular service times: Evolution of delay, state dependent failures and semiconductor wafer fabrication-
dc.typeConference-
dc.identifier.scopusid2-s2.0-54949100446-
dc.type.rimsCONF-
dc.citation.beginningpage247-
dc.citation.endingpage252-
dc.citation.publicationname4th IEEE Conference on Automation Science and Engineering, CASE 2008-
dc.identifier.conferencecountryUnited States-
dc.contributor.localauthorMorrison, James R-

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