Flow lines with regular service times: Evolution of delay, state dependent failures and semiconductor wafer fabrication
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Morrison, James R | ko |
| dc.date.accessioned | 2009-05-27T02:31:04Z | - |
| dc.date.available | 2009-05-27T02:31:04Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2008-08-23 | - |
| dc.identifier.citation | 4th IEEE Conference on Automation Science and Engineering, CASE 2008, pp.247 - 252 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/9163 | - |
| dc.language | English | - |
| dc.language.iso | en_US | en |
| dc.publisher | IEEE | - |
| dc.title | Flow lines with regular service times: Evolution of delay, state dependent failures and semiconductor wafer fabrication | - |
| dc.type | Conference | - |
| dc.identifier.wosid | 000261320400041 | - |
| dc.identifier.scopusid | 2-s2.0-54949100446 | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 247 | - |
| dc.citation.endingpage | 252 | - |
| dc.citation.publicationname | 4th IEEE Conference on Automation Science and Engineering, CASE 2008 | - |
| dc.identifier.conferencecountry | US | - |
| dc.identifier.conferencelocation | Washington, DC | - |
| dc.embargo.liftdate | 9999-12-31 | - |
| dc.embargo.terms | 9999-12-31 | - |
| dc.contributor.localauthor | Morrison, James R | - |
- Appears in Collection
- IE-Conference Papers(학술회의논문)
- Files in This Item
This item is cited by other documents in WoS
| ⊙ Detail Information in WoSⓡ | Click to see |  |
| ⊙ Cited 3 items in WoS | Click to see citing articles in |  |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.