Sintering effect of annealed FePt nanocrystal films observed by magnetic force microscopy

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dc.contributor.authorHyun, Cko
dc.contributor.authorLee, DohChangko
dc.contributor.authorIsrael, Cko
dc.contributor.authorKorge, BAko
dc.contributor.authorde Lozanne, Ako
dc.date.accessioned2013-03-07T15:08:08Z-
dc.date.available2013-03-07T15:08:08Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2006-12-
dc.identifier.citationIEEE TRANSACTIONS ON MAGNETICS, v.42, no.12, pp.3799 - 3802-
dc.identifier.issn0018-9464-
dc.identifier.urihttp://hdl.handle.net/10203/90465-
dc.description.abstractChemically synthesized FePt nanocrystals can exhibit room temperature ferromagnetism after being annealed at temperatures above 500 degrees C. In thick films composed of FePt nanocrystals, the coercivity can be quite large. However, the coercivity of thin films has been found to decrease significantly with decreasing thickness, to the point that ferromagnetism at room temperature is lost. We studied 12 to 55 nm thick films by using magnetic force microscopy (MFM) under external applied fields. We made smooth films by spin casting 4-nm-diameter FePt nanocrystals and annealing them at 605 degrees C-630 degrees C. Thin FePt films showed lower coercivity than thick films. To help interpret the MFM images, we obtained complementary magnetic and structural data by superconducting quantum interference device (SQUID) magnetometry, transmission electron microscopy (TEM), and X-ray diffraction. We conclude that the magnetic properties of these films are strongly affected by nanocrystal aggregation that occurs during annealing.-
dc.languageEnglish-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.subjectPHASE-TRANSFORMATION-
dc.subjectTHIN-FILMS-
dc.subjectNANOPARTICLES-
dc.titleSintering effect of annealed FePt nanocrystal films observed by magnetic force microscopy-
dc.typeArticle-
dc.identifier.wosid000242390200005-
dc.identifier.scopusid2-s2.0-33845599152-
dc.type.rimsART-
dc.citation.volume42-
dc.citation.issue12-
dc.citation.beginningpage3799-
dc.citation.endingpage3802-
dc.citation.publicationnameIEEE TRANSACTIONS ON MAGNETICS-
dc.identifier.doi10.1109/TMAG.2006.884386-
dc.contributor.localauthorLee, DohChang-
dc.contributor.nonIdAuthorHyun, C-
dc.contributor.nonIdAuthorIsrael, C-
dc.contributor.nonIdAuthorKorge, BA-
dc.contributor.nonIdAuthorde Lozanne, A-
dc.type.journalArticleArticle-
dc.subject.keywordAuthorFePt-
dc.subject.keywordAuthormagnetic force microscopy (MFM)-
dc.subject.keywordAuthornanocrystal-
dc.subject.keywordAuthorsintering-
dc.subject.keywordPlusPHASE-TRANSFORMATION-
dc.subject.keywordPlusTHIN-FILMS-
dc.subject.keywordPlusNANOPARTICLES-
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