Degradation studies on high-voltage-driven organic light-emitting device using in situ on-operation method with scanning photoelectron microscopy

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We investigated the degradation behavior of a high-voltage-driven organic light-emitting device (OLED) by operating the device in an ultrahigh-vacuum environment. In situ on-operation method provided the initial degradation process when the OLED was biased inside an analysis chamber. The degraded area was probed by scanning photoelectron microscopy (SPEM) using synchrotron. SPEM showed that the degradation was accompanied by a local drift of indium tin oxide (anode) toward Al (cathode) and that the heat from the degraded area separated the cathode from the Alq(3) layer, forming large bubbles. These results also indicate that microbubbles were formed under the Alq(3), implying, before popping, the existence of local high-temperature degradation spots.
Publisher
AMER INST PHYSICS
Issue Date
2008-09
Language
English
Article Type
Article
Citation

APPLIED PHYSICS LETTERS, v.93, no.13

ISSN
0003-6951
DOI
10.1063/1.3046541
URI
http://hdl.handle.net/10203/89197
Appears in Collection
RIMS Journal Papers
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