Correlation of topography measurements of NIST SRM 2460 standard bullets by four techniques

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dc.contributor.authorSong J.ko
dc.contributor.authorVorburger T.ko
dc.contributor.authorRenegar T.ko
dc.contributor.authorRhee H.ko
dc.contributor.authorZheng A.ko
dc.contributor.authorMa L.ko
dc.contributor.authorLibert J.ko
dc.contributor.authorBallou S.ko
dc.contributor.authorBachrach B.ko
dc.contributor.authorBogart K.ko
dc.date.accessioned2013-03-06T15:04:21Z-
dc.date.available2013-03-06T15:04:21Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2006-
dc.identifier.citationMEASUREMENT SCIENCE AND TECHNOLOGY, v.17, no.3, pp.500 - 503-
dc.identifier.issn0957-0233-
dc.identifier.urihttp://hdl.handle.net/10203/87352-
dc.description.abstractThree optical instruments including an interferometric microscope, a Nipkow disc confocal microscope and a laser scanning confocal microscope and a stylus instrument are used for the measurements of bullet profile signatures of a National Institute of Standards and Technology (NIST) Standard Reference Material (SRM) 2460 standard bullet. The two-dimensional profile signatures are compared with the virtual bullet standard signature established by the same stylus instrument. The bullet signature differences are quantified by the maximum cross-correlation function CCFmax. If the compared signatures were exactly the same, CCFmax would be 100%. Comparison results show close agreement among the four techniques for bullet profile signature measurements. The average CCFmax values are higher than 90%. This supports the possibility of using surface topography techniques for ballistic identifications as an alternative to the current technology based on image comparisons.-
dc.languageEnglish-
dc.publisherIOP PUBLISHING LTD-
dc.titleCorrelation of topography measurements of NIST SRM 2460 standard bullets by four techniques-
dc.typeArticle-
dc.identifier.wosid000236227200008-
dc.identifier.scopusid2-s2.0-31644447898-
dc.type.rimsART-
dc.citation.volume17-
dc.citation.issue3-
dc.citation.beginningpage500-
dc.citation.endingpage503-
dc.citation.publicationnameMEASUREMENT SCIENCE AND TECHNOLOGY-
dc.identifier.doi10.1088/0957-0233/17/3/S07-
dc.contributor.localauthorRhee H.-
dc.contributor.nonIdAuthorSong J.-
dc.contributor.nonIdAuthorVorburger T.-
dc.contributor.nonIdAuthorRenegar T.-
dc.contributor.nonIdAuthorZheng A.-
dc.contributor.nonIdAuthorMa L.-
dc.contributor.nonIdAuthorLibert J.-
dc.contributor.nonIdAuthorBallou S.-
dc.contributor.nonIdAuthorBachrach B.-
dc.contributor.nonIdAuthorBogart K.-
dc.type.journalArticleArticle; Proceedings Paper-
dc.subject.keywordAuthorcross-correlation function-
dc.subject.keywordAuthorstandard bullet-
dc.subject.keywordAuthorsurface metrology-
dc.subject.keywordAuthorstandard reference material-
dc.subject.keywordAuthortopography measurement-
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