Atomic arrangement variations of [0001]-tilt grain boundaries in ZnO thin films grown on p-Si substrates due to thermal treatment

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dc.contributor.authorShin, JWko
dc.contributor.authorLee, JeongYongko
dc.contributor.authorNo, YSko
dc.contributor.authorJung, JHko
dc.contributor.authorKim, TWko
dc.contributor.authorChoi, WKko
dc.date.accessioned2013-03-06T13:15:02Z-
dc.date.available2013-03-06T13:15:02Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2007-04-
dc.identifier.citationAPPLIED PHYSICS LETTERS, v.90, no.18-
dc.identifier.issn0003-6951-
dc.identifier.urihttp://hdl.handle.net/10203/87076-
dc.description.abstractThe plane-view high-resolution transmission electron microscopy (HRTEM) images in ZnO thin films grown on p-Si substrates showed that (10 $(1) over bar $0) asymmetric grain boundaries with a periodic array of strain contrast features existed in a sparse columnar structure for as- grown ZnO thin films and that (11 $(2) over bar $0) asymmetric grain boundaries and (851 $(3) over bar $0) symmetric grain boundaries existed in a dense columnar structure for annealed ZnO thin films. The atomic arrangement variations of [0001]- tilt grain boundaries in ZnO thin films grown on Si substrates due to thermal treatment are described on the basis of the HRTEM results. (c) 2007 American Institute of Physics.-
dc.languageEnglish-
dc.publisherAMER INST PHYSICS-
dc.subjectELECTRONIC-STRUCTURE-
dc.subjectSAPPHIRE-
dc.subjectLASERS-
dc.titleAtomic arrangement variations of [0001]-tilt grain boundaries in ZnO thin films grown on p-Si substrates due to thermal treatment-
dc.typeArticle-
dc.identifier.wosid000246210000038-
dc.identifier.scopusid2-s2.0-34247873099-
dc.type.rimsART-
dc.citation.volume90-
dc.citation.issue18-
dc.citation.publicationnameAPPLIED PHYSICS LETTERS-
dc.identifier.doi10.1063/1.2732177-
dc.contributor.localauthorLee, JeongYong-
dc.contributor.nonIdAuthorShin, JW-
dc.contributor.nonIdAuthorNo, YS-
dc.contributor.nonIdAuthorJung, JH-
dc.contributor.nonIdAuthorKim, TW-
dc.contributor.nonIdAuthorChoi, WK-
dc.type.journalArticleArticle-
dc.subject.keywordPlusELECTRONIC-STRUCTURE-
dc.subject.keywordPlusSAPPHIRE-
dc.subject.keywordPlusLASERS-
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