Comprehensive study of time-lapsed peak shift in InGaN quantum well structures: Discrimination of localization effect from internal field effect

Abstract

Time-lapsed emission peak shift behaviors in blue-light-emitting InGaN multiple quantum well (MQW) laser diodes with different well widths are systematically investigated by means of excitation power-dependent, time-resolved optical analysis. By investigating the main emission peak shift as a function of both time evolution and excitation power density, the amount of time-lapsed emission peak shift can be differentiated by two contributions: the excitation power dependent and independent ones. The authors conclude that the power-dependent (power-independent) time-lapsed peak shift can be attributed to the internal electric-field (carrier localization) effect present in vertical growth (lateral in-plane) direction of InGaN MQW laser diode structures.