DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lee H.-K. | ko |
dc.contributor.author | Kim K.-j. | ko |
dc.contributor.author | Kang T.-H. | ko |
dc.contributor.author | Chung J.W. | ko |
dc.contributor.author | Kim B. | ko |
dc.date.accessioned | 2013-03-06T08:17:58Z | - |
dc.date.available | 2013-03-06T08:17:58Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2008 | - |
dc.identifier.citation | SURFACE SCIENCE, v.602, no.4, pp.914 - 918 | - |
dc.identifier.issn | 0039-6028 | - |
dc.identifier.uri | http://hdl.handle.net/10203/86416 | - |
dc.description.abstract | We have investigated adsorption of furan on Si(100) at room temperature using high resolution photoemission spectroscopy (PES) and near edge X-ray absorption fine structure (NEXAFS) in the partial electron yield (PEY) mode. The Si 2p, C 1s, O 1s spectra of furan on Si(100) show that furan is chemisorbed on Si(100)-2 x 1 through [4 + 2] cycloaddition. NEXAFS has been conducted to characterize the adsorption geometry of furan on Si(100). Since the pi(*) orbital of C = C bond showed a good angle dependence in carbon K-edge NEXAFS spectra, the angle 28 +/- 2 degrees determined from NEXAFS spectra appears to deviate from a theoretical value of 19 degrees for the [4 + 2] cycloaddition by 9 degrees, mostly due to the intrinsic defects on the Si(100)-2 x 1 substrate surface. (C) 2007 Elsevier B.V. All rights reserved. | - |
dc.language | English | - |
dc.publisher | ELSEVIER SCIENCE BV | - |
dc.subject | PHOTOELECTRON-SPECTROSCOPY | - |
dc.subject | TEMPERATURE | - |
dc.subject | MOLECULES | - |
dc.subject | BEAMLINE | - |
dc.subject | SURFACE | - |
dc.subject | FILMS | - |
dc.title | Adsorption geometry of furan on Si(100)-2 x 1 | - |
dc.type | Article | - |
dc.identifier.wosid | 000253930700014 | - |
dc.identifier.scopusid | 2-s2.0-39149140369 | - |
dc.type.rims | ART | - |
dc.citation.volume | 602 | - |
dc.citation.issue | 4 | - |
dc.citation.beginningpage | 914 | - |
dc.citation.endingpage | 918 | - |
dc.citation.publicationname | SURFACE SCIENCE | - |
dc.identifier.doi | 10.1016/j.susc.2007.12.019 | - |
dc.contributor.localauthor | Kim K.-j. | - |
dc.contributor.nonIdAuthor | Lee H.-K. | - |
dc.contributor.nonIdAuthor | Kang T.-H. | - |
dc.contributor.nonIdAuthor | Chung J.W. | - |
dc.contributor.nonIdAuthor | Kim B. | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordAuthor | furan | - |
dc.subject.keywordAuthor | Si(100) | - |
dc.subject.keywordAuthor | adsorption | - |
dc.subject.keywordAuthor | PES | - |
dc.subject.keywordAuthor | NEXAFS | - |
dc.subject.keywordAuthor | molecular orientation | - |
dc.subject.keywordAuthor | organic-semiconductor interface | - |
dc.subject.keywordPlus | PHOTOELECTRON-SPECTROSCOPY | - |
dc.subject.keywordPlus | TEMPERATURE | - |
dc.subject.keywordPlus | MOLECULES | - |
dc.subject.keywordPlus | BEAMLINE | - |
dc.subject.keywordPlus | SURFACE | - |
dc.subject.keywordPlus | FILMS | - |
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