CuPt-type ordering and ordered domains in CdxZn1-xTe epilayers grown on ZnTe buffer layers

Abstract

We have studied ordering and ordered domains in CdxZn1-x Te grown molecular beam epitaxy on ZnTe buffer layer. The composition of CdxZn1-xTe films films was determined by X-ray diffraction patterns using Vegard's law. Selected area diffraction patterns and transition in order to investigate ordered domains in CdxZn1-xTe thin films. The strong contrast modulations along the [110] direction perpendicular to the growth direction were observed in samples with composition x = 0.15 similar to 0.76. Superstructure reflection spots corresponding to a CuPt type ordering were observed. Ordered domain regions were randomly distributed in CdxZn1-xTe thin films. These results provide important information on the microstructural properties for enhancing efficiencies of devices operating in the blue-green region of the spectrum.