Property degradation of Pb(Zr0.52,Ti0.48)O3 (PZT) thin films with thickness and aging time
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Song, HW | ko |
| dc.contributor.author | Shin, H | ko |
| dc.contributor.author | Kim, S | ko |
| dc.contributor.author | No, Kwangsoo | ko |
| dc.date.accessioned | 2013-03-04T01:35:26Z | - |
| dc.date.available | 2013-03-04T01:35:26Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2002 | - |
| dc.identifier.citation | IFFF 2002 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/81331 | - |
| dc.language | English | - |
| dc.publisher | GORDON BREACH SCI PUBL LTD | - |
| dc.title | Property degradation of Pb(Zr0.52,Ti0.48)O3 (PZT) thin films with thickness and aging time | - |
| dc.type | Article | - |
| dc.type.rims | ART | - |
| dc.citation.publicationname | IFFF 2002 | - |
| dc.contributor.localauthor | No, Kwangsoo | - |
| dc.contributor.nonIdAuthor | Song, HW | - |
| dc.contributor.nonIdAuthor | Shin, H | - |
| dc.contributor.nonIdAuthor | Kim, S | - |
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