DC Field | Value | Language |
---|---|---|
dc.contributor.author | Shin, Hyun Jung | ko |
dc.contributor.author | Woo, Jung Won | ko |
dc.contributor.author | Hong, Daniel Seungbum | ko |
dc.contributor.author | Jeon, Jong Up | ko |
dc.contributor.author | Park, Eugene | ko |
dc.contributor.author | No, Kwangsoo | ko |
dc.date.accessioned | 2013-03-03T21:24:09Z | - |
dc.date.available | 2013-03-03T21:24:09Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2000 | - |
dc.identifier.citation | INTEGRATED FERROELECTRICS, v.31, no.1-4, pp.163 - 171 | - |
dc.identifier.issn | 1058-4587 | - |
dc.identifier.uri | http://hdl.handle.net/10203/80506 | - |
dc.description.abstract | Applying voltage between the conductive tip in atomic force microscopy (AFM) and bottom electrode through Pb(Zr,Ti)O-3 (PZT) films can cause switching of ferroelectric domains. Formation and imaging of ferroelectric domains in nanometer scale could be applied to develop the future ultrahigh-density memory device. Relevant issues, i.e. bit (induced ferroelectric domains) size dependence on applied voltage and pulse width, are discussed. The bit size showed a log-linear dependence on the pulse width and a linear dependence on the pulse voltage. Using the analysis of electric field distribution, the size of the induced bits under certain pulse voltage and width was estimated. | - |
dc.language | English | - |
dc.publisher | GORDON BREACH SCI PUBL LTD | - |
dc.title | Formation of ferroelectric nano-domains using scanning force microscopy for the future application of memory devices | - |
dc.type | Article | - |
dc.identifier.wosid | 000167524300017 | - |
dc.type.rims | ART | - |
dc.citation.volume | 31 | - |
dc.citation.issue | 1-4 | - |
dc.citation.beginningpage | 163 | - |
dc.citation.endingpage | 171 | - |
dc.citation.publicationname | INTEGRATED FERROELECTRICS | - |
dc.identifier.doi | 10.1080/10584580008215650 | - |
dc.contributor.localauthor | Hong, Daniel Seungbum | - |
dc.contributor.localauthor | No, Kwangsoo | - |
dc.contributor.nonIdAuthor | Shin, Hyun Jung | - |
dc.contributor.nonIdAuthor | Woo, Jung Won | - |
dc.contributor.nonIdAuthor | Jeon, Jong Up | - |
dc.contributor.nonIdAuthor | Park, Eugene | - |
dc.description.isOpenAccess | N | - |
dc.type.journalArticle | Article; Proceedings Paper | - |
dc.subject.keywordAuthor | atomic force microscopy | - |
dc.subject.keywordAuthor | ferroelectric films | - |
dc.subject.keywordAuthor | domain size | - |
dc.subject.keywordAuthor | coercive field | - |
dc.subject.keywordAuthor | electric field analysis | - |
dc.subject.keywordPlus | THIN-FILMS | - |
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