Structural Properties of GexSi1-x/Si(100) Grown by Solid Phase EpitaxyH.S. Kim, J.J. Lee, K.H. Kim, T.K. Im, C.S. Yoo, C.K. Choi and J.Y. Lee
- Publisher
- 한국물리학회
- Issue Date
- 1996-12
- Language
- Korean
- Citation
응용물리, v.9, no.1, pp.79 - 84
- Appears in Collection
- MS-Journal Papers(저널논문)
- Files in This Item
- There are no files associated with this item.
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