DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, SS | ko |
dc.contributor.author | Ahn, YM | ko |
dc.contributor.author | Lee, KG | ko |
dc.contributor.author | Gill, BL | ko |
dc.contributor.author | Shin, Sung-Chul | ko |
dc.date.accessioned | 2013-03-02T23:56:10Z | - |
dc.date.available | 2013-03-02T23:56:10Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1996-09 | - |
dc.identifier.citation | IEEE TRANSACTIONS ON MAGNETICS, v.32, no.5, pp.4095 - 1 | - |
dc.identifier.issn | 0018-9464 | - |
dc.identifier.uri | http://hdl.handle.net/10203/76122 | - |
dc.description.abstract | The effective thermal conductivities of SiN and TbFeCo thin films were measured by comparing the length and width of polarizing microscope image of thermo-magnetically written domains with those of calculated isotherms for the trilayer structure of substrate/Si3N4/Tb22Fe70C08/Si3N4. The resulting data were applied to the quadrillayer structure of substrate/Si3N4/Tb22Fe70C08/Si3N4/Al, and the length of calculated isotherms was turned out to agree with that of written domain. | - |
dc.language | English | - |
dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
dc.title | Measurement of thermal conductivities of SiN and TbFeCo films | - |
dc.type | Article | - |
dc.identifier.wosid | A1996VM25800237 | - |
dc.identifier.scopusid | 2-s2.0-0030245031 | - |
dc.type.rims | ART | - |
dc.citation.volume | 32 | - |
dc.citation.issue | 5 | - |
dc.citation.beginningpage | 4095 | - |
dc.citation.endingpage | 1 | - |
dc.citation.publicationname | IEEE TRANSACTIONS ON MAGNETICS | - |
dc.contributor.localauthor | Shin, Sung-Chul | - |
dc.contributor.nonIdAuthor | Kim, SS | - |
dc.contributor.nonIdAuthor | Ahn, YM | - |
dc.contributor.nonIdAuthor | Lee, KG | - |
dc.contributor.nonIdAuthor | Gill, BL | - |
dc.type.journalArticle | Article; Proceedings Paper | - |
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