CONDUCTION-BAND DISCONTINUITIES; LEVEL TRANSIENT SPECTROSCOPY; SINGLE HETEROSTRUCTURE; ISOTYPE HETEROJUNCTION; PROFILING TECHNIQUE; DEEP LEVELS; CENTERS; OFFSETS; DIODES; TRAPS
JOURNAL OF APPLIED PHYSICS, v.81, no.11, pp.7362 - 7366
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.