Photoinduced Current Transient Spectroscopy(PICTS)를 이용한 다공질 실리콘의 깊은준위 연구

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Publisher
한국물리학회
Issue Date
1998-01
Language
Korean
Citation

응용물리, v.11, no.1, pp.45 - 49

ISSN
1013-7009
URI
http://hdl.handle.net/10203/70245
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