Reliability Study of CMOS FinFETs
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Choi, Yang-Kyu | - |
| dc.contributor.author | Ha, Daewon | - |
| dc.contributor.author | Snow, Eric | - |
| dc.contributor.author | Bokor, Jeffrey | - |
| dc.contributor.author | King, Tsu-Jae | - |
| dc.date.accessioned | 2007-06-27T07:01:17Z | - |
| dc.date.available | 2007-06-27T07:01:17Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2003-12 | - |
| dc.identifier.citation | IEEE, v., no., pp.177 - 180 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/694 | - |
| dc.description.sponsorship | MARCO contract 2001-MT-887 SRC contract 2000-NJ-850 | en |
| dc.language | ENG | - |
| dc.language.iso | en_US | en |
| dc.publisher | IEEE | - |
| dc.title | Reliability Study of CMOS FinFETs | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 177 | - |
| dc.citation.endingpage | 180 | - |
| dc.citation.publicationname | IEEE | - |
| dc.identifier.conferencecountry | United States | - |
| dc.identifier.conferencecountry | United States | - |
| dc.contributor.localauthor | Choi, Yang-Kyu | - |
| dc.contributor.nonIdAuthor | Ha, Daewon | - |
| dc.contributor.nonIdAuthor | Snow, Eric | - |
| dc.contributor.nonIdAuthor | Bokor, Jeffrey | - |
| dc.contributor.nonIdAuthor | King, Tsu-Jae | - |
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