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E2SRI: Learning to Super-Resolve Intensity Images from Events Mohammad Mostafavi; Nam, Yeongwoo; Choi, Jonghyun; Yoon, Kuk-Jin, IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, v.44, no.10, pp.6890 - 6909, 2022-10 |
Enhancement of fluorescence confocal scanning microscopy lateral resolution by use of structured illumination Kim, Taejoong; Gweon, Dae-Gab; Lee, Jun-Hee, MEASUREMENT SCIENCE TECHNOLOGY, v.20, no.5, 2009-05 |
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