Browse "ME-Journal Papers(저널논문)" by Subject THICKNESS-PROFILE
Showing results 1 to 4 of 4
| Design of a prism to compensate the angular-shift error of the Acousto-optic Tunable Filter Ryu, Sung-Yoon; You, Jang-Woo; Kwak, Yoon-Keun; Kim, Soo-Hyun, OPTICS EXPRESS, v.16, no.22, pp.17138 - 17147, 2008-10 |
| Fast, precise, tomographic measurements of thin films Ghim, YS; Kim, Seung-Woo, APPLIED PHYSICS LETTERS, v.91, no.9, pp.E63 - E63, 2007-08 |
| Spectrally resolved phase-shifting interference microscopy: technique based on optical coherence tomography for profiling a transparent film on a patterned substrate Debnath, Sanjit K.; Kim, Seung-Woo; Kothiyal, Mahendra P.; Hariharan, Parameswaran, APPLIED OPTICS, v.49, no.34, pp.6624 - 6629, 2010-12 |
| Spectrally resolved white-light interferometry for 3D inspection of a thin-film layer structure Ghim, Young-Sik; Kim, Seung-Woo, APPLIED OPTICS, v.48, no.4, pp.799 - 803, 2009-02 |
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