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1
EFFECT OF SCATTERING COEFFICIENT ON THE AXIAL RESOLUTION OF REFLECTANCE CONFOCAL MICROSCOPY IN TURBID MEDIA

Chun, BS; Kim,T J; Yoo, HK; Lee, SW; Gweon, Dae-Gab, Focus on Microscopy 2008, 2008-04-13

2
Lateral resolution enhancement in confocal self-interference microscopy with commercial calcite plate

Kang, DK; Yoo, HK; Lee, SW; Gweon Dae Gab, 2nd International Symposium on Nano-manufacturing, 2004-11-03

3
MEASUREMENT OF PSF IN CONFOCAL SELF-INTERFERENCE MICROSCOPY

Kang, DK; Yoo, HK; Gweon, Dae-Gab, Focus on Microscopy 2006, 2006-04-09

4
Measurement of sub-micrometer features based on the topographic contrast using reflection confocal microscopy

Gweon, Dae-Gab; Lee, SW; Kang, DK; Yoo, HK; Kim, TJ; Lee, SW; Kim, KS, 2nd International Symposium on Nano-manufacturing, Optical Society of Korea, 2004-11-03

5
Measuring PSFs for Fluorescence Nanoscopy

Gweon Dae Gab; Yoo, HK; Song, IC, Nanoengineering Symposium 2005, 2005-10-28

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