Browse "ME-Conference Papers(학술회의논문)" by Author Paik, JH

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Evaluation of thermal deformation behavior in electronic package using UV moire interferometry

Paik, JH; Lee, Soon-Bok, 2005 International Symposium on Electronics Materials and Packaging, EMAP 2005, v.2005, pp.209 - 214, 2005-12-11

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