Evaluation of thermal deformation behavior in electronic package using UV moire interferometry

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Issue Date
2005-12-11
Language
ENG
Citation

2005 International Symposium on Electronics Materials and Packaging, EMAP 2005, v.2005, pp.209 - 214

URI
http://hdl.handle.net/10203/139233
Appears in Collection
ME-Conference Papers(학술회의논문)
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