Evaluation of thermal deformation behavior in electronic package using UV moire interferometry

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dc.contributor.authorPaik, JH-
dc.contributor.authorLee, Soon-Bok-
dc.date.accessioned2013-03-17T03:08:43Z-
dc.date.available2013-03-17T03:08:43Z-
dc.date.created2012-02-06-
dc.date.issued2005-12-11-
dc.identifier.citation2005 International Symposium on Electronics Materials and Packaging, EMAP 2005, v.2005, no., pp.209 - 214-
dc.identifier.urihttp://hdl.handle.net/10203/139233-
dc.languageENG-
dc.titleEvaluation of thermal deformation behavior in electronic package using UV moire interferometry-
dc.typeConference-
dc.identifier.scopusid2-s2.0-33847329083-
dc.type.rimsCONF-
dc.citation.volume2005-
dc.citation.beginningpage209-
dc.citation.endingpage214-
dc.citation.publicationname2005 International Symposium on Electronics Materials and Packaging, EMAP 2005-
dc.identifier.conferencecountryJapan-
dc.identifier.conferencecountryJapan-
dc.contributor.localauthorLee, Soon-Bok-
dc.contributor.nonIdAuthorPaik, JH-
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ME-Conference Papers(학술회의논문)
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