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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| Understanding the origin of device instability in amorphous oxide semiconductor thin film transistors Chang, Kee-Joo; Ryu, B.; Noh, HK, 15th International Symposium on the Physics of Semiconductors and Applications, ISPSA, 2011-07 | |
| Stability of boron dopants at the Si/SiO2 interface Oh, Y. J.; Hwang, J.-H.; Noh, H.-K.; Bang, J.; Ry, B.; Chang, Kee-Joo, The 18th Korean Conference on Semiconductors, KCS, 2011-02 | |
| Localization behavior of hydrogenated graphene and graphene nanoribbons Choe, D.-H.; Bang, J.; Chang, Kee-Joo, The 13th Asian Workshop on First-Principles Electronic Structure Calculations, 2010-11 | |
| O-vacancy in amorphous indium-gallium-zinc oxide thin film transistors: origin of negative bias illumination stress instability Noh, H.-K.; Ryu, B.; Choi, E.-A.; Chang, Kee-Joo, 한국반도체학술대회, 한국반도체학회, 2011-02 | |
| Boron segregation and effect of point defects in Si/SiO2 interface Oh, Y. J.; Noh, H.-K.; Chang, Kee-Joo, The 14th Asian Workshop on First-Principles Electronic Structure Calculations, The University of Tokyo, 2011 | |
| Ferromagnetism in bulk and nanowire systems of Fe1.3Ge Lee, A. T.; Yoon, H.; Kim, B.; Chang, Kee-Joo, 한국물리학회 봄 학술논문발표회, 한국물리학회, 2011-04 | |
| Density functional calculations of the Schottky barrier height and effective work function in Ni/oxide interfaces Noh, HK; Oh, YJ; Chang, Kee-Joo, 2012 APS March Meeting, APS, 2012-02 | |
| Segregation and diffusion of boron dopants in the Si/SiO2 interface Oh, YJ; Noh, HK; Kim, GM; Chang, Kee-Joo, 2012 APS March Meeting, APS, 2012-02 | |
| Electronic structure and defects in high-k dielectrics and oxide semiconductors Ryu, B.; Noh, H.-K.; Bang, J.; Choi, E.-A.; Lee, W.-J.; Chang, Kee-Joo, International Union of Materials Research Societies - International Conference on Electronic Materials 2010, 2010-08 | |
| Role of O-vacancy defects in devices based on high-k dielectrics and amorphous oxide semiconductors Chang, Kee-Joo; Ryu, B.; Noh, H.-K.; Choi, E.-A., 3rd ACCMS Working Group Meeting on Advances in Nano-device Simulation, ACCMS, 2011-03 |