Showing results 1 to 3 of 3
Fast identification of short, linear perfectly conducting cracks in a bistatic measurement configuration Kang, Sangwoo; Lim, Mikyoung; Park, Won-Kwang, JOURNAL OF COMPUTATIONAL PHYSICS, v.468, 2022-11 |
Inverse Problem for a Planar Conductivity Inclusion Choi, Doosung; Helsing, Johan; Kang, Sangwoo; Lim, Mikyoung, SIAM JOURNAL ON IMAGING SCIENCES, v.16, no.2, pp.969 - 995, 2023-06 |
Monostatic sampling methods in limited-aperture configuration Kang, Sangwoo; Lim, Mikyoung, APPLIED MATHEMATICS AND COMPUTATION, v.427, 2022-08 |
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