Fast identification of short, linear perfectly conducting cracks in a bistatic measurement configuration

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In this study, we propose a sampling-type algorithm for a real-time identification of a set of short, linear perfectly conducting cracks in a two-dimensional bistatic measurement configuration. The indicator function is defined based on the asymptotic formula of the far -field pattern of the scattered field due to cracks. To clarify the applicability of the proposed algorithm, we investigate the mathematical structure of the indicator function using the Jacobi-Anger expansion formula. In particular, we derive an asymptotic formula for the indicator function in terms of the Bessel functions of the first kind and the parameters that depend on the bistatic measurement configuration. This asymptotic structure reveals intrinsic properties of the indicator function. We validate the theoretical results via various simulation results with synthetic and experimental data.(C) 2022 Elsevier Inc. All rights reserved.
Publisher
ACADEMIC PRESS INC ELSEVIER SCIENCE
Issue Date
2022-11
Language
English
Article Type
Article
Citation

JOURNAL OF COMPUTATIONAL PHYSICS, v.468

ISSN
0021-9991
DOI
10.1016/j.jcp.2022.111479
URI
http://hdl.handle.net/10203/298482
Appears in Collection
MA-Journal Papers(저널논문)
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