X-RAY AND DLTS CHARACTERIZATIONS OF INXGA1-X AS(X-LESS-THAN-0.03)/GAAS LAYERS GROWN BY VPE USING AN IN/GA ALLOY SOURCE
- Publisher
- SPRINGER VERLAG
- Issue Date
- 1989-08
- Language
- English
- Article Type
- Article
- Citation
APPLIED PHYSICS A-MATERIALS SCIENCE PROCESSING, v.49, no.2, pp.143 - 147
- ISSN
- 0947-8396
- Appears in Collection
- Files in This Item
- There are no files associated with this item.
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