X-RAY AND DLTS CHARACTERIZATIONS OF INXGA1-X AS(X-LESS-THAN-0.03)/GAAS LAYERS GROWN BY VPE USING AN IN/GA ALLOY SOURCE

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Publisher
SPRINGER VERLAG
Issue Date
1989-08
Language
English
Article Type
Article
Citation

APPLIED PHYSICS A-MATERIALS SCIENCE PROCESSING, v.49, no.2, pp.143 - 147

ISSN
0947-8396
DOI
10.1007/BF00616292
URI
http://hdl.handle.net/10203/62013
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