Showing results 1 to 1 of 1
X-ray laminographic application of lens-coupled CMOS detector for PCB inspection Kim, H.K.; Jeon, S.C.; Cho, Gyuseong; Lim, S.-H., 2001 IEEE Nuclear Science Symposium Conference Record, pp.1620 - 1623, IEEE, 2001-11-04 |
Discover