DSpace at KOASAS: X-ray laminographic application of lens-coupled CMOS detector for PCB inspection

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College of Engineering(공과대학)Dept. of Nuclear and Quantum Engineering(원자력및양자공학과)NE-Conference Papers(학술회의논문)

X-ray laminographic application of lens-coupled CMOS detector for PCB inspection

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Kim, H.K. / Jeon, S.C. / Cho, Gyuseong researcher / Lim, S.-H.

Publisher: IEEE

Issue Date: 2001-11-04

Language: English

Citation: 2001 IEEE Nuclear Science Symposium Conference Record, pp.1620 - 1623

URI: http://hdl.handle.net/10203/126950

Appears in Collection: NE-Conference Papers(학술회의논문)

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X-ray laminographic application of lens-coupled CMOS detector for PCB inspection

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